DocumentCode :
2530729
Title :
Dependence of strain amplitude on loss mechanisms in plate resonators
Author :
Klessina, J. ; Ballato, Arthur
Author_Institution :
US Army Res. Lab., Fort Monmouth, NJ, USA
fYear :
1996
fDate :
5-7 Jun 1996
Firstpage :
366
Lastpage :
370
Abstract :
Piezoelectric elements are used in a variety of applications such as optical modulators, microactuators, and certain types of transducers and resonant sensors, where it is necessary to know the maximum amplitude obtainable. Conduction, dielectric, and viscous losses all limit the amplitude. We consider high frequency crystal plates in the one-dimensional approximation. By the use of a complex piezoelectric coupling coefficient incorporating all three loss mechanisms, the limiting amplitude of the fundamental mode is found. Examples are given for AT, BT, and SC quartz cuts, along with lithium niobate and lead titanate ceramic. The influence of electrode mass loading on amplitude is also determined, along with the magnitude of the interfacial stress. The stress levels can attain significant levels
Keywords :
crystal resonators; electrodes; lead compounds; lithium compounds; losses; piezoceramics; quartz; AT quartz cuts; BT quartz cuts; LiNbO3; PbTiO3; SC quartz cuts; SiO2; complex piezoelectric coupling coefficient; conduction losses; dielectric losses; electrode mass loading; fundamental mode; high frequency crystal plates; interfacial stress; limiting amplitude; loss mechanisms; maximum amplitude; one-dimensional approximation; piezoelectric elements; plate resonators; strain amplitude; viscous losses; Amplitude modulation; Capacitive sensors; Dielectric losses; Microactuators; Optical losses; Optical modulation; Optical sensors; Piezoelectric transducers; Resonance; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-3309-8
Type :
conf
DOI :
10.1109/FREQ.1996.559881
Filename :
559881
Link To Document :
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