DocumentCode
2531331
Title
Transient, finite element-boundary element methods for modeling high field effects in nonhomogeneous solid dielectrics
Author
Driga, M.D. ; Wu, Albert
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
1998
fDate
22-25 Jun 1998
Firstpage
543
Lastpage
547
Abstract
A novel transient Finite Element-Boundary Element (FE-BE) numerical code is presented. This FE-BE method code calculates electric field distributions in high voltage insulation systems with complex boundaries and with nonhomogeneous characteristics. The very accurate representation of the 3-D space distribution of electric fields is achieved by using, concomitantly, the finite and the boundary element methods-in time-thus eliminating the drawbacks characteristic to each of the methods when applied separately. The boundary element method (BEM) is applied to the lossless regions and the finite element method (FEM) is applied to the lossy and nonhomogeneous domains of the field. Undesirable phenomena, due to high voltage gradient, are usually localized at the onset. To accurately model them, separate temporal and spatial scales, different from the scale for regular discharges, are adopted. On the temporal side, a particularly small time step to accommodate the frequency is chosen. For the space, a rezoning capability is adopted to gain fine grid solution. The coarse grid solution is used to interpolate the boundary conditions for the newly created points in a recursive refinement process based on an adaptive procedure. Several practical examples of the transient modeling of high field effects are presented
Keywords
boundary-elements methods; electric fields; finite element analysis; inhomogeneous media; insulation; transient analysis; 3D distribution; electric field; finite element-boundary element method; high field effects; high voltage insulation; nonhomogeneous solid dielectric; numerical code; transient model; Boundary conditions; Boundary element methods; Capacitors; Dielectrics; Finite element methods; Insulation; Modems; Power system modeling; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location
Vasteras
Print_ISBN
0-7803-4237-2
Type
conf
DOI
10.1109/ICSD.1998.709343
Filename
709343
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