Title :
FPGA-based Advanced Digital Signal Inspector for internal signals of pin-limited systems-on-package
Author :
Mostardini, Luca ; Benvenuti, Luca ; Bacciarelli, Luca ; Fanucci, Luca ; Rosadini, Christian ; Rocchi, Alessandro ; De Marinis, M.
Author_Institution :
Dept. of Inf. Eng., Univ. of Pisa, Pisa, Italy
Abstract :
The paper presents an Advanced Digital Signal Inspector (ADSI) used for acquisition and analysis of the internal digital of a System on Package (SoP) with a limited number of pins. The system is made of a commercial FPGA-board, connected to the module for data sampling and controlled by PC via USB; a suited graphical interface allows for configuration, multi trace real time data display and post processing. The proposed platform can be used to extract and monitor simultaneously up to 4 digital signals, and an ADC is used to monitor one additional analog signal. The ADSI has been successfully applied for the characterization of an automotive SoP based on a MEM gyro sensor interfaced to an ASIC for proper signal conditioning. The ADC was connected to an external accelerometer to evaluate the module behaviour when applying mechanical shocks.
Keywords :
application specific integrated circuits; automotive electronics; data acquisition; field programmable gate arrays; integrated circuit testing; signal processing equipment; system-on-package; ADC; ADSI; ASIC; FPGA; MEM gyro senso; PC; USB; advanced digital signal inspector; application specific integrated circuits; automotive SoP; data sampling; external accelerometer; field programmable gate arrays; graphical interface; mechanical shocks; pin-limited systems-on-package; Automotive engineering; Control systems; Data mining; Displays; Packaging; Pins; Real time systems; Signal analysis; Signal sampling; Universal Serial Bus;
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2009. IDAACS 2009. IEEE International Workshop on
Conference_Location :
Rende
Print_ISBN :
978-1-4244-4901-9
Electronic_ISBN :
978-1-4244-4882-1
DOI :
10.1109/IDAACS.2009.5343033