• DocumentCode
    2531666
  • Title

    Deposition and STM investigation of single-walled carbon nanotubes on GaAs(110)

  • Author

    Ruppalt, Laura B. ; Albrecht, Peter M ; Lyding, Joseph W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Champaign, IL, USA
  • fYear
    2004
  • fDate
    16-19 Aug. 2004
  • Firstpage
    13
  • Lastpage
    15
  • Abstract
    We have applied single walled carbon nanotubes (SWNTs) to the cleaved GaAs(110) surface in ultra high vacuum using a dry contact transfer (DCT) procedure and studied the system using a scanning tunneling microscope (STM). STM images reveal a clean transfer of predominantly isolated SWNTs to the semiconductor surface, with minimal additional contamination to the substrate surface. Atomic features of the nanotubes and underlying substrate can be simultaneously resolved and suggest the preferential alignment of isolated SWNTs along the [110] direction on the GaAs surface. Scanning tunneling spectroscopy (STS) measurements reveal SWNT bandgaps contained wholly within the substrate gap, with the measured values of those energy gaps comparing favorably to theoretically predicted values.
  • Keywords
    carbon nanotubes; energy gap; nanotechnology; scanning tunnelling microscopy; scanning tunnelling spectroscopy; surface contamination; vacuum deposition; C; GaAs; STM images; STS; [110] direction; cleaved GaAs(110) surface; dry contact transfer; energy gaps; scanning tunneling microscopy; scanning tunneling spectroscopy; semiconductor surface; single-walled carbon nanotubes bandgap; surface contamination; Carbon nanotubes; Discrete cosine transforms; Energy measurement; Microscopy; Pollution measurement; Substrates; Surface cleaning; Surface contamination; Tunneling; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2004. 4th IEEE Conference on
  • Print_ISBN
    0-7803-8536-5
  • Type

    conf

  • DOI
    10.1109/NANO.2004.1392233
  • Filename
    1392233