Title :
Some microstructural characteristics of relaxor ferroelectrics
Author :
Barber, D.J. ; Hilton, A.D. ; Baba-Kishi, K.Z.
Author_Institution :
Dept. of Phys., Essex Univ., Colchester, UK
Abstract :
A brief description of some of the main uses and dielectric characteristics of ferroelectric relaxor materials is given. Current ideas concerning the microstructural and microchemical origins of the dielectric properties of lead-based perovskite-structured oxide relaxors are presented. The unique ability of transmission electron microscopy to address most of these questions is outlined and illustrated with some recent results on the effects of excess lead oxide on relaxor microstructures
Keywords :
ceramics; crystal microstructure; ferroelectric materials; lead compounds; permittivity; transmission electron microscope examination of materials; PbMgO3NbO3; PbScO3NbO3; PbScO3TaO3; ceramics; dielectric characteristics; dielectric constant; lead-based perovskite-structured oxide relaxors; microchemical origins; microstructural characteristics; relaxor ferroelectrics; transmission electron microscopy; Dielectric materials; Ferroelectric materials; Frequency; Indium; Lead compounds; Microscopy; Niobium compounds; Optical materials; Relaxor ferroelectrics; Temperature;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
Conference_Location :
Beijing
DOI :
10.1109/ICPADM.1988.38373
