DocumentCode :
2532033
Title :
Scanning tunneling microscopy using dynamic laser heating
Author :
Ballard, Joshua ; Shi, Dongxia ; Carmichael, Erin ; Pappu, Sravan ; Lyding, Joe ; Gruebele, Martin
Author_Institution :
Beckman Inst. of Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
fYear :
2004
fDate :
16-19 Aug. 2004
Firstpage :
68
Lastpage :
70
Abstract :
A hydrogen passivated Si(100)-2×1 surface is studied using ultrafast laser excitation with a novel total internal reflection geometry. The incoherent tip and sample heating dynamics are studied, and it is shown that as long as the STM feedback is faster than the heating and cooling processes, atomic scale imaging can be achieved, even in the presence of significant tip and sample expansion and contraction. This opens the door for studies of surface processes on the ultrafast timescale.
Keywords :
elemental semiconductors; high-speed optical techniques; hydrogen; laser beam effects; laser materials processing; passivation; scanning tunnelling microscopy; silicon; STM; Si; atomic scale imaging; cooling process; dynamic laser heating; heating dynamics; hydrogen passivation; scanning tunneling microscopy; surface process; total internal reflection geometry; ultrafast laser excitation; Cooling; Geometrical optics; Heating; Hydrogen; Laser excitation; Laser feedback; Microscopy; Optical reflection; Surface emitting lasers; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN :
0-7803-8536-5
Type :
conf
DOI :
10.1109/NANO.2004.1392252
Filename :
1392252
Link To Document :
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