DocumentCode :
2532079
Title :
A low power programmable band gap reference circuit with subthreshold MOSFETs
Author :
Ramasamy, S. ; Venkataramani, B. ; Meenatchisundaram, P.
Author_Institution :
Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol., Tiruchirappalli
fYear :
2008
fDate :
19-21 Nov. 2008
Firstpage :
1
Lastpage :
6
Abstract :
In this paper, a novel approach is proposed for the design of low power CMOS programmable band gap reference circuit. In the literature, an inversion technique is proposed to make the voltage reference to be independent of temperature by using parasitic bipolar transistors. In the above technique, this paper proposes the use of MOSFETs operating in subthreshold region for generating a voltage with negative temperature coefficient. Programmability is proposed for the first time by changing the aspect ratio, the current flowing through diode connected MOSFETs and gain introduced through the inversion technique. To study the performance of the proposed programmable scheme, the band gap reference is implemented in tsmc035 CMOS process with 3.7 V power supply. The simulation carried out in Eldo spice indicates that temperature coefficients are 7 ppm/ldrc, 23 ppm/ldrc and 30 ppm/ldrc respectively over the temperature range of -10ldrc to 120ldrc for output voltages 0.9 V, 1.2 V and 1.5 V. It dissipates 53 muW, 134 muW and 302 muW for output voltages 0.9 V, 1.2 V and 1.5 V respectively. The estimated silicon area is 0.023 mm2.
Keywords :
CMOS digital integrated circuits; MOSFET; bipolar transistors; Eldo spice; inversion technique; low power CMOS programmable band gap reference circuit; negative temperature coefficient; parasitic bipolar transistors; power 134 muW; power 302 muW; power 53 muW; subthreshold MOSFET; temperature 10 degC to 120 degC; voltage 0.9 V; voltage 1.2 V; voltage 1.5 V; voltage 3.7 V; voltage reference; Bipolar transistors; CMOS process; Circuits; Diodes; MOSFETs; Photonic band gap; Power supplies; Silicon; Temperature distribution; Voltage; Band gap reference; CMOS; CTAT; PTAT; Subthreshold; temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4244-2408-5
Electronic_ISBN :
978-1-4244-2409-2
Type :
conf
DOI :
10.1109/TENCON.2008.4766816
Filename :
4766816
Link To Document :
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