Application of the Ωscan to the sorting of doubly rotated quartz blanks

Author

Berger, H. ; Bradaczez, H. ; Bradaczek, H. ; Hildebrandy, G.

Author_Institution

Phys. Inst., Humboldt-Univ., Berlin, Germany

fYear

1996

fDate

5-7 Jun 1996

Firstpage

412

Lastpage

415

Abstract

The X-ray Ω-scan method allows the quick (cycle time, e.g., 15 sec.) determination of both rotation angles of doubly rotated, rectangular or round quartz blanks with high precision (a few arcsec.). It was designed originally for AT cut blanks and has been extended to SC (and FC) cuts. However, the principle of the method is applicable to blanks of any orientation. The lattice orientation is determined on an absolute scale. Therefore, any calibration of the instrument is unnecessary. Based on this method, charges of blanks in a certain orientation range (up to several degrees in the rotation angles) can be sorted semiautomatically or automatically, respectively, using the equipment and procedure which is described below

Keywords

X-ray applications; crystal oscillators; quartz; 15 s; FC cuts; SC cuts; SiO₂; X-ray Ω-scan method; doubly rotated quartz blanks; lattice orientation; orientation range; quartz oscillator plates; rectangular blanks; rotation angles; round blanks; Acceleration; Calibration; Goniometers; Instruments; Lattices; Optical reflection; Oscillators; Rotation measurement; Sorting; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.

Conference_Location

Honolulu, HI

Print_ISBN

0-7803-3309-8

Type

conf

DOI

10.1109/FREQ.1996.559889

Filename

559889