DocumentCode
2532119
Title
The origins of the SPAR-H method’s performance shaping factor multipliers
Author
Boring, Ronald L. ; Blackman, Harold S.
Author_Institution
Idaho National Laboratory, Idaho Falls, USA
fYear
2007
fDate
26-31 Aug. 2007
Firstpage
177
Lastpage
184
Abstract
The Standardized Plant Analysis Risk-Human Reliability Analysis (SPAR-H) method has proved to be a reliable, easy-to-use method for human reliability analysis. Calculation of human error probability (HEP) rates is especially straightforward, starting with pre-defined nominal error rates for cognitive vs. action oriented tasks, and incorporating performance shaping factor (PSF) multipliers upon those nominal error rates. SPAR-H uses eight PSFs with multipliers typically corresponding to nominal, degraded, and severely degraded human performance for individual PSFs. Additionally, some PSFs feature multipliers to reflect enhanced performance. Although SPAR-H enjoys widespread use among industry and regulators, current source documents on SPAR-H such as NUREG/CR-6883 do not provide a clear account of the origin of these multipliers. The present paper redresses this shortcoming and documents the historic development of the SPAR-H PSF multipliers, from the initial use of nominal error rates, to the selection of the eight PSFs, to the mapping of multipliers to available data sources such as a Technique for Human Error Rate Prediction (THERP). Where error rates were not readily derived from THERP and other sources, expert judgment was used to extrapolate appropriate values. In documenting key background information on the multipliers, this paper provides a much needed cross-reference for human reliability practitioners and researchers of SPAR-H to validate analyses and research findings.
Keywords
Accidents; Application specific processors; Degradation; Error analysis; Error probability; Humans; Performance analysis; Regulators; Risk analysis; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Human Factors and Power Plants and HPRCT 13th Annual Meeting, 2007 IEEE 8th
Conference_Location
Monterey, CA, USA
Print_ISBN
978-1-4244-0306-6
Electronic_ISBN
978-1-4244-0306-6
Type
conf
DOI
10.1109/HFPP.2007.4413202
Filename
4413202
Link To Document