DocumentCode
2532138
Title
Influence of rapid thermal annealing on the molecular structure of PEDOT-PSS thin films
Author
Schaarschmidt, Antje ; Farah, Abdiaziz A. ; Aby, Arun ; Helmy, Amr S.
Author_Institution
Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
fYear
2009
fDate
4-8 Oct. 2009
Firstpage
351
Lastpage
352
Abstract
The effect of rapid thermal annealing on PEDOT-PSS films has been investigated by Raman spectroscopy. The analysis indicates the formation of an annealing-induced doping in the PEDOT structure, suggesting a modification of the electronic structure.
Keywords
Raman spectroscopy; electronic structure; organic semiconductors; rapid thermal annealing; semiconductor doping; thin films; PEDOT-PSS thin films; Raman spectroscopy; doping; electronic structure; molecular structure; rapid thermal annealing; Crystallization; Polymer films; Raman scattering; Rapid thermal annealing; Rapid thermal processing; Semiconductor films; Spectroscopy; Substrates; Temperature; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location
Belek-Antalya
ISSN
1092-8081
Print_ISBN
978-1-4244-3680-4
Electronic_ISBN
1092-8081
Type
conf
DOI
10.1109/LEOS.2009.5343084
Filename
5343084
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