Title :
Plasmonic imaging beyond the diffraction limit
Author :
Wei, Feifei ; Liu, Zhaowei
Author_Institution :
Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
Abstract :
The imaging resolution of conventional optical lens system is limited by the diffraction to the order of half wavelength. We describe a few emerging microscopy techniques that utilize optical hyperlens, far-field superlens, and plasmonic structured illumination to improve the resolution beyond the diffraction limit.
Keywords :
image resolution; lenses; light diffraction; nanophotonics; optical images; optical microscopy; plasmonics; far-field superlens; imaging resolution; microscopy technique; nanoscale imaging; optical diffraction; optical hyperlens; optical lens system; plasmonic imaging; plasmonic structured illumination; Image reconstruction; Image resolution; Lenses; Optical diffraction; Optical imaging; Optical microscopy; Optical propagation; Optical surface waves; Plasmons; Transfer functions;
Conference_Titel :
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location :
Belek-Antalya
Print_ISBN :
978-1-4244-3680-4
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2009.5343089
