Title :
Design automation tools for built-in self-test implementations
Author :
Tungate, Stan ; He, Ping ; Seshadri, Sowmya ; Stroud, Charles ; Sullivan, Malissa ; Damarla, T. Raju
Author_Institution :
Lexmark Int. Inc., Lexington, KY, USA
Abstract :
A suite of computer-aided design (CAD) tools is described which were developed for the automatic insertion of three different versions of circular built-in self-test (BIST) in digital circuit designs. The CAD tools operate either on a netlist or VHDL description of the circuit such that the final circuit description, complete with the circular BIST logic, can be implemented in digital application specific integrated circuits (ASICs)
Keywords :
application specific integrated circuits; built-in self test; design for testability; digital integrated circuits; hardware description languages; logic CAD; software tools; ASIC; BIST logic; CAD; automatic insertion; built-in self-test implementation; circular built-in self-test; computer-aided design tools; design automation tools; digital application specific integrated circuits; digital circuit design; logic simulation; loop analysis; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Design automation; Digital circuits; Flip-flops; Integrated circuit testing; Software testing; System testing;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547685
