Design automation tools for built-in self-test implementations

Author

Tungate, Stan ; He, Ping ; Seshadri, Sowmya ; Stroud, Charles ; Sullivan, Malissa ; Damarla, T. Raju

Author_Institution

Lexmark Int. Inc., Lexington, KY, USA

fYear

1996

fDate

16-19 Sep 1996

Firstpage

113

Lastpage

119

Abstract

A suite of computer-aided design (CAD) tools is described which were developed for the automatic insertion of three different versions of circular built-in self-test (BIST) in digital circuit designs. The CAD tools operate either on a netlist or VHDL description of the circuit such that the final circuit description, complete with the circular BIST logic, can be implemented in digital application specific integrated circuits (ASICs)

Keywords

application specific integrated circuits; built-in self test; design for testability; digital integrated circuits; hardware description languages; logic CAD; software tools; ASIC; BIST logic; CAD; automatic insertion; built-in self-test implementation; circular built-in self-test; computer-aided design tools; design automation tools; digital application specific integrated circuits; digital circuit design; logic simulation; loop analysis; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Design automation; Digital circuits; Flip-flops; Integrated circuit testing; Software testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '96, Test Technology and Commercialization. Conference Record

Conference_Location

Dayton, OH

ISSN

1088-7725

Print_ISBN

0-7803-3379-9

Type

conf

DOI

10.1109/AUTEST.1996.547685

Filename

547685