DocumentCode
2532576
Title
Vibration sensitivity of AQP SAW oscillators
Author
Andres, D. ; Montress, G.K. ; Greer, J.A. ; Parker, T.E.
Author_Institution
Electron. Syst. Lab., Raytheon Co., Lexington, MA, USA
fYear
1996
fDate
5-7 Jun 1996
Firstpage
449
Lastpage
456
Abstract
All Quartz Package (AQP) SAW oscillators with low vibration sensitivity are achievable by minimizing the external stresses that might otherwise be transferred to the AQP SAW device. If these external stresses are at their lowest possible level, then frit geometry becomes a factor in establishing just how low the vibration sensitivity may be. Optimizing the frit geometry often involves trade-offs with the overall AQP SAW device´s size requirements. Through the use of finite element modeling, it was determined that the AQP´s cover and substrate thicknesses also could be used to improve vibration sensitivity. The model predicted a decrease in vibration sensitivity, with increasing cover thickness, for the vibration sensitivity component, γ1 , in a direction normal to the SAW substrate. The model also predicted a degradation in vibration sensitivity with increasing substrate thickness. These results were confirmed experimentally. The other benefit of increased cover thickness was a sizable reduction in the variation of performance among the devices tested. The increased cover thickness decreases the sensitivity of the AQP SAW to variations in the mounting material. The influence of AQP cover thickness on an insufficiently stiffened oscillator was examined. The result was similar, except that the variation in cover thickness had a more dramatic affect than in the sufficiently stiffened case
Keywords
finite element analysis; quartz; sensitivity; surface acoustic wave oscillators; AQP SAW oscillators; SiO2; all quartz package; cover thickness; external stresses; finite element modeling; frit geometry; mounting material; substrate thickness; vibration sensitivity; Degradation; Finite element methods; Geometry; Oscillators; Packaging; Predictive models; Stress; Surface acoustic wave devices; Surface acoustic waves; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
Conference_Location
Honolulu, HI
Print_ISBN
0-7803-3309-8
Type
conf
DOI
10.1109/FREQ.1996.559894
Filename
559894
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