DocumentCode :
2532649
Title :
Modeling, simulation, and testing of the mechanical dynamics of an RF MEMS switch
Author :
Massad, Jordan E. ; Sumali, Hartono ; Epp, David S. ; Dyck, Christopher W.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2005
fDate :
24-27 July 2005
Firstpage :
237
Lastpage :
240
Abstract :
Mechanical dynamics can be a determining factor for the switching speed of radio-frequency microelectromechanical systems (RF MEMS) switches. This paper presents the simulation of the mechanical motion of a microswitch under actuation. The switch has a plate suspended by springs. When an electrostatic actuation is applied, the plate moves toward the substrate and closes the switch. Simulations are calculated via a high-fidelity finite element model that couples solid dynamics with electrostatic actuation. It incorporates non-linear coupled dynamics and accommodates fabrication variations. Experimental modal analysis gives results in the frequency domain that verifies the natural frequencies and mode shapes predicted by the model. An effective 1D model is created and used to calculate an actuation voltage waveform that minimizes switch velocity at closure. In the experiment, the switch is actuated with this actuation voltage, and the displacements of the switch at various points are measured using a laser Doppler velocimeter through a microscope. The experiments are repeated on several switches from different batches. The experimental results verify the model.
Keywords :
dynamic testing; finite element analysis; microswitches; RF MEMS switch; actuation voltage waveform; electrostatic actuation; finite element model; frequency domain; laser Doppler velocimeter; mechanical dynamics; mechanical motion; nonlinear coupled dynamics; radio-frequency microelectromechanical system switches; solid dynamics; switching speed; Electrostatic actuators; Microelectromechanical systems; Microswitches; Radio frequency; Radiofrequency microelectromechanical systems; Solid modeling; Springs; Switches; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MEMS, NANO and Smart Systems, 2005. Proceedings. 2005 International Conference on
Print_ISBN :
0-7695-2398-6
Type :
conf
DOI :
10.1109/ICMENS.2005.77
Filename :
1540826
Link To Document :
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