Title :
Simulation-based testability analysis and fault diagnosis
Author :
Sen, Sujoy ; Nath, Sulakshana S. ; Malepati, Venkata N. ; Pattipati, Krishna R.
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
Abstract :
In the past, system-level testability analysis and fault diagnosis have been largely based an either structure or manual cause-effect analysis (e.g. qualitative models, dependency models, multi-signal models, signed directed graphs). This process is time-consuming. This paper proposes a general methodology for automatically extracting multi-signal diagnostic inference models of systems via fault-simulation of design descriptions. Specifically it addresses the problem of generating inference models of digital/analog circuits and complex functional blocks (e.g. servo mechanisms, process control systems, flight control systems) for system-level testability analysis and fault diagnosis. The proposed method: (1) ensures a detailed failure-modes and effects analysis of systems, (2) automatically defines tests with well-defined stimuli, observations and test limits, (3) creates an efficient and intuitive test strategy by using test precedences and test levels, and (4) eases the process of inference model verification
Keywords :
automatic testing; circuit analysis computing; diagnostic reasoning; digital simulation; directed graphs; fault diagnosis; fault trees; cause-effect analysis; complex functional blocks; dependency models; digital/analog circuits; failure analysis; fault diagnosis; fault simulation; flight control; inference model verification; inference models; multi-signal diagnostic inference models; multi-signal models; process control; qualitative models; servomechanisms; signed directed graphs; stimuli; system-level testability analysis; testability analysis; Aerospace control; Analog circuits; Analytical models; Automatic testing; Circuit faults; Circuit testing; Fault diagnosis; Process control; Servomechanisms; System testing;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547688