• DocumentCode
    2532805
  • Title

    Dynamic voltage collapse prediction in a practical power system with support vector machine

  • Author

    Nizam, Muhammad ; Mohamed, Azah ; Al-Dabbagh, Majid ; Hussain, Aini

  • Author_Institution
    Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents dynamic voltage collapse prediction on an actual power system using support vector machines. Dynamic voltage collapse prediction is first determined based on the PTSI calculated from information in dynamic simulation output. Simulations were carried out on a practical 87 bus test system by considering load increase as the contingency. The data collected from the time domain simulation is then used as input to the SVM in which support vector regression is used as a predictor to determine the dynamic voltage collapse indices of the power system. To reduce training time and improve accuracy of the SVM, the kernel function type and kernel parameter are considered. To verify the effectiveness of the proposed SVM method, its performance is compared with the multi layer perceptron neural network (MLPNN). Studies show that the SVM gives faster and more accurate results for dynamic voltage collapse prediction compared with the MLPNN.
  • Keywords
    multilayer perceptrons; power engineering computing; power system dynamic stability; support vector machines; actual power system; dynamic voltage collapse prediction; kernel function type; kernel parameter; multilayer perceptron neural network; support vector machines; Artificial neural networks; Modeling; Neural networks; Power system dynamics; Power system simulation; Power system stability; Power systems; Predictive models; Support vector machines; Voltage; Dynamic voltage collapse; artificial neural network; prediction; support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2008 - 2008 IEEE Region 10 Conference
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4244-2408-5
  • Electronic_ISBN
    978-1-4244-2409-2
  • Type

    conf

  • DOI
    10.1109/TENCON.2008.4766855
  • Filename
    4766855