Testability analysis utilizing a relational database

With the current emphasis on integrated diagnostics, the importance of testability analysis as an integral part of the development process for system hardware design, integrated built-in-test (BIT) software, and test program set (TPS) applications cannot be overlooked. The current escalation in test development tools for RF and analog TPS applications has further enhanced the role of testability analysis and runtime expert tools to aid the diagnostic process by providing figures of merit for fault coverage compliance. The utilization of these tools, however, has proven prohibitive doe to their rigidity in structured format difficulty in use, and cost considerations. A low cost and readily available solution to this impasse has been realized through adaptation of industry standard relational databases. This paper describes adaptation of the relational database to perform such analyses that are currently being implemented for new program prime system designs