• DocumentCode
    2532865
  • Title

    Step response calculation of VLSI low loss interconnect using S-parameters

  • Author

    Bandurski, Wojciech ; Wardzinska, Agnieszka

  • Author_Institution
    Multimedia Telecommun. & Microelectron., Poznan Univ. of Technol., Poznan, Poland
  • fYear
    2012
  • fDate
    18-21 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This document describes step response calculation based on scattering parameters. To obtain the analytical formula of step response we approximate S-parameters and then introduce some simplification in step response formula. We present the results of simulation of VLSI interconnect, the RLC parameters are calculated using IE3D.
  • Keywords
    S-parameters; VLSI; integrated circuit interconnections; step response; IE3D; RLC parameters; S-parameters; VLSI low loss interconnect; scattering parameters; step response calculation; Approximation methods; Integrated circuit interconnections; Integrated circuit modeling; Load modeling; Power transmission lines; Scattering parameters; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals and Electronic Systems (ICSES), 2012 International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    978-1-4673-1710-8
  • Electronic_ISBN
    978-1-4673-1709-2
  • Type

    conf

  • DOI
    10.1109/ICSES.2012.6382238
  • Filename
    6382238
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2532865