Title :
Catastrophic optical mirror damage of high power diode lasers
Author :
Tomm, Jens W. ; Ziegler, Mathias ; Elsaesser, Thomas
Author_Institution :
Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin, Germany
Abstract :
The catastrophic optical mirror damage (COMD) process at the front facets of 808 and 650 nm edge-emitting broad-area semiconductor lasers is addressed with focus on two aspects. Firstly, there is the methodological request to make the process measurable, i.e. to spatially and temporally resolve it. Secondly, the microscopic processes accompanying the COMD are discussed in line with recent experiments.
Keywords :
laser beam effects; laser mirrors; semiconductor lasers; spatiotemporal phenomena; catastrophic optical mirror damage process; edge-emitting broad-area semiconductor lasers; front facets; high-power diode lasers; microscopic processes; spatio-temporal phenomena; wavelength 650 nm; wavelength 808 nm; Cameras; Diode lasers; High speed optical techniques; Image analysis; Mirrors; Optical imaging; Optical pulses; Power lasers; Temperature; Thermal degradation;
Conference_Titel :
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location :
Belek-Antalya
Print_ISBN :
978-1-4244-3680-4
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2009.5343130
