• DocumentCode
    2532931
  • Title

    Catastrophic optical mirror damage of high power diode lasers

  • Author

    Tomm, Jens W. ; Ziegler, Mathias ; Elsaesser, Thomas

  • Author_Institution
    Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin, Germany
  • fYear
    2009
  • fDate
    4-8 Oct. 2009
  • Firstpage
    597
  • Lastpage
    599
  • Abstract
    The catastrophic optical mirror damage (COMD) process at the front facets of 808 and 650 nm edge-emitting broad-area semiconductor lasers is addressed with focus on two aspects. Firstly, there is the methodological request to make the process measurable, i.e. to spatially and temporally resolve it. Secondly, the microscopic processes accompanying the COMD are discussed in line with recent experiments.
  • Keywords
    laser beam effects; laser mirrors; semiconductor lasers; spatiotemporal phenomena; catastrophic optical mirror damage process; edge-emitting broad-area semiconductor lasers; front facets; high-power diode lasers; microscopic processes; spatio-temporal phenomena; wavelength 650 nm; wavelength 808 nm; Cameras; Diode lasers; High speed optical techniques; Image analysis; Mirrors; Optical imaging; Optical pulses; Power lasers; Temperature; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
  • Conference_Location
    Belek-Antalya
  • ISSN
    1092-8081
  • Print_ISBN
    978-1-4244-3680-4
  • Electronic_ISBN
    1092-8081
  • Type

    conf

  • DOI
    10.1109/LEOS.2009.5343130
  • Filename
    5343130