• DocumentCode
    253300
  • Title

    Software reliability growth model with logistic-exponential TEF in imperfect debugging environment

  • Author

    Dhar, Joydip ; Anamika ; Ingle, Seema ; Sheshker, Yaminee

  • Author_Institution
    Dept. of Appl. Sci., ABV-Indian Inst. of Inf. Technol. & Manage., Gwalior, India
  • fYear
    2014
  • fDate
    9-11 May 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The most important component of software quality is software reliability. Every software industry wants to develop error and fault free software. Software is systematically checked and detected faults are removed before it delivered into the market. Software reliability growth models help the software industries to develop fault free and reliable software. In this project, we have done an analysis of NHPP software reliability growth model based on the logistic-exponential testing-effort in imperfect debugging environment and also software release-time for reaching different reliability level is calculated. Calculations are done on the actual dataset which is study by Ohba 1984. Parameters are estimated using LSE in Matlab platform, some measures are calculated for evaluation of proposed model and compare our model with few existing model and observed that our proposed model is better fitted compare to other existing models.
  • Keywords
    DP industry; program debugging; software fault tolerance; software houses; software quality; Matlab platform; NHPP software reliability growth model; error free software; fault detection; fault free software; imperfect debugging environment; logistic-exponential TEF; logistic-exponential testing-effort; software industry; software quality; Databases; Reliability; Software; Testing; Non-homogeneous Poisson process (NHPP); Software release-time; Software reliability; Software reliability growth model (SRGM); Testing effort function (TEF);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advances and Innovations in Engineering (ICRAIE), 2014
  • Conference_Location
    Jaipur
  • Print_ISBN
    978-1-4799-4041-7
  • Type

    conf

  • DOI
    10.1109/ICRAIE.2014.6909281
  • Filename
    6909281