DocumentCode :
253300
Title :
Software reliability growth model with logistic-exponential TEF in imperfect debugging environment
Author :
Dhar, Joydip ; Anamika ; Ingle, Seema ; Sheshker, Yaminee
Author_Institution :
Dept. of Appl. Sci., ABV-Indian Inst. of Inf. Technol. & Manage., Gwalior, India
fYear :
2014
fDate :
9-11 May 2014
Firstpage :
1
Lastpage :
4
Abstract :
The most important component of software quality is software reliability. Every software industry wants to develop error and fault free software. Software is systematically checked and detected faults are removed before it delivered into the market. Software reliability growth models help the software industries to develop fault free and reliable software. In this project, we have done an analysis of NHPP software reliability growth model based on the logistic-exponential testing-effort in imperfect debugging environment and also software release-time for reaching different reliability level is calculated. Calculations are done on the actual dataset which is study by Ohba 1984. Parameters are estimated using LSE in Matlab platform, some measures are calculated for evaluation of proposed model and compare our model with few existing model and observed that our proposed model is better fitted compare to other existing models.
Keywords :
DP industry; program debugging; software fault tolerance; software houses; software quality; Matlab platform; NHPP software reliability growth model; error free software; fault detection; fault free software; imperfect debugging environment; logistic-exponential TEF; logistic-exponential testing-effort; software industry; software quality; Databases; Reliability; Software; Testing; Non-homogeneous Poisson process (NHPP); Software release-time; Software reliability; Software reliability growth model (SRGM); Testing effort function (TEF);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Recent Advances and Innovations in Engineering (ICRAIE), 2014
Conference_Location :
Jaipur
Print_ISBN :
978-1-4799-4041-7
Type :
conf
DOI :
10.1109/ICRAIE.2014.6909281
Filename :
6909281
Link To Document :
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