Title :
Contact mechanics description of inelastic displacement response of a nano-positioning device
Author :
Starr, Michael J. ; Reedy, E. David, Jr. ; Corwin, Alex D. ; Carpick, Robert W. ; Flater, Erin E.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
A classical mechanistic model was developed to capture the existence of pre-sliding tangential deflection (PSTD) in contacting polysilicon and coated polysilicon surfaces. For the purposes of modeling asperity friction, experiments have shown, and been supported through detailed finite element analyses, that frictional forces developed through tangential sliding scale linearly through a material parameter known as the junction strength. A junction strength model coupled with a discrete quasi-static contact mechanics analysis, using contacting surface descriptions sampled by AFM from actual polysilicon surfaces, predicts inelastic tangential displacements that are qualitatively consistent with observed PSTD response. The simulations imply that the existence of PSTD depends not only on the spatial characteristics of contacting surfaces, but also on the local loading characteristics.
Keywords :
atomic force microscopy; coatings; elemental semiconductors; finite element analysis; friction; mechanical contact; nanopositioning; silicon; AFM; Si; classical mechanistic model; coated polysilicon surfaces; contact mechanics description; finite element analyses; frictional forces; inelastic displacement response; junction strength model; nanopositioning device; presliding tangential deflection; spatial characteristics; surface descriptions; Atomic force microscopy; Clamps; Force measurement; Friction; Laboratories; Micromechanical devices; Nanopositioning; Physics; Scanning electron microscopy; Testing;
Conference_Titel :
MEMS, NANO and Smart Systems, 2005. Proceedings. 2005 International Conference on
Print_ISBN :
0-7695-2398-6
DOI :
10.1109/ICMENS.2005.3