DocumentCode
2533354
Title
Low strain multiple stack quantum dot infrared photodetectors for multispectral and high resolution hyperspectral imaging
Author
Vines, P. ; Tan, C.H. ; David, J.P.R. ; Attaluri, R.S. ; Vandervelde, T.E. ; Krishna, S. ; Jang, W.-Y. ; Hayat, M.M.
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
fYear
2009
fDate
4-8 Oct. 2009
Firstpage
166
Lastpage
167
Abstract
Quantum dot infrared photodetectors (QDIP) have received considerable interest for over a decade due to their sensitivity to normal incidence radiation and long excited carrier lifetimes. We report on a series of QDIPs with 30-80 GaAs-AlGaAs DWELL stacks. Dark current in these devices is constant at a given electric field, indicating that strain does not increase significantly as the number of DWELL stacks are increased. Each QDIP shows high responsivity and specific detectivity as well as a spectral response that varies significantly with applied bias. Four different spectra obtained at different applied biases on the 80 stack QDIP, with peak wavelengths ranging from 5.5mum to 10.0mum is shown. The wide variation in shape and peak wavelength of the intrinsic responses makes these QDIPs very attractive as multispectral imagers in the MWIR and LWIR regions.
Keywords
III-V semiconductors; aluminium compounds; dark conductivity; gallium arsenide; image sensors; infrared detectors; infrared imaging; photodetectors; semiconductor quantum dots; semiconductor quantum wells; DWELL stacks; GaAs-AlGaAs; LWIR regions; MWIR regions; dark current; dot-in-a-well structure; hyperspectral imaging; incidence radiation; multiple stack quantum dot infrared photodetectors; multispectral imaging; photodetector responsivity; spectral response; wavelength 5.5 mum to 10.0 mum; Capacitive sensors; Charge carrier lifetime; Dark current; Hyperspectral imaging; Image resolution; Infrared imaging; Multispectral imaging; Photodetectors; Quantum dots; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location
Belek-Antalya
ISSN
1092-8081
Print_ISBN
978-1-4244-3680-4
Electronic_ISBN
1092-8081
Type
conf
DOI
10.1109/LEOS.2009.5343154
Filename
5343154
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