DocumentCode
2533367
Title
Multispectral classification with bias-tunable quantum dots in a well focal plane array
Author
Jang, Woo-Yong ; Paskaleva, Biliana S. ; Hayat, Majeed M. ; Bender, Steven C. ; Krishna, Sanjay
Author_Institution
ECE Dept., Univ. of New Mexico, Albuquerque, NM, USA
fYear
2009
fDate
4-8 Oct. 2009
Firstpage
168
Lastpage
169
Abstract
The authors have demonstrated that the bias-tunability of quantum-dots-in-a-well photodetector (DWELL) FPA can be utilized for material classification. With the ongoing improvement and development of hardware and software for data acquisition and analysis, which allows for the increased bias-tunability and efficient data collection and processing, the DWELL FPA is expected to have a wide range of applications.
Keywords
focal planes; image classification; photodetectors; quantum dots; quantum well devices; DWELL FPA; bias tunability; bias tunable quantum dots-in-a-well focal plane array; data acquisition; data analysis; data collection; data processing; material classification; multispectral classification; quantum dots-in-a-well photodetector; Detectors; Filters; Hyperspectral imaging; Hyperspectral sensors; Laboratories; Layout; Photodetectors; Pixel; Quantum dots; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location
Belek-Antalya
ISSN
1092-8081
Print_ISBN
978-1-4244-3680-4
Electronic_ISBN
1092-8081
Type
conf
DOI
10.1109/LEOS.2009.5343155
Filename
5343155
Link To Document