Title :
Multispectral classification with bias-tunable quantum dots in a well focal plane array
Author :
Jang, Woo-Yong ; Paskaleva, Biliana S. ; Hayat, Majeed M. ; Bender, Steven C. ; Krishna, Sanjay
Author_Institution :
ECE Dept., Univ. of New Mexico, Albuquerque, NM, USA
Abstract :
The authors have demonstrated that the bias-tunability of quantum-dots-in-a-well photodetector (DWELL) FPA can be utilized for material classification. With the ongoing improvement and development of hardware and software for data acquisition and analysis, which allows for the increased bias-tunability and efficient data collection and processing, the DWELL FPA is expected to have a wide range of applications.
Keywords :
focal planes; image classification; photodetectors; quantum dots; quantum well devices; DWELL FPA; bias tunability; bias tunable quantum dots-in-a-well focal plane array; data acquisition; data analysis; data collection; data processing; material classification; multispectral classification; quantum dots-in-a-well photodetector; Detectors; Filters; Hyperspectral imaging; Hyperspectral sensors; Laboratories; Layout; Photodetectors; Pixel; Quantum dots; Voltage;
Conference_Titel :
LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE
Conference_Location :
Belek-Antalya
Print_ISBN :
978-1-4244-3680-4
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2009.5343155
