Title :
A versatile I/O with robust impedance calibration for various memory interfaces
Author :
Koo, Kyoung-Hoi ; Lee, Soo-Kyung ; Seo, Jin-Ho ; Ko, Myeong-Lyong ; Kim, Jae-Whui
Author_Institution :
Mixed Signal Core, Core Dev. R&D Team, Samsung Electron., Youngin
Abstract :
A versatile I/O buffer is proposed to interface DDR/DDR2/GDDR3 memory types. A new robust impedance calibration scheme which fills the role of off-chip driver (OCD) and on-die terminator (ODT) for improving signal integrity is introduced. The proposed calibration scheme minimizes quantization error and maintains 30~300Omega impedance within 3% variations
Keywords :
buffer storage; calibration; driver circuits; DDR/DDR2/GDDR3 memory; I/O buffer; memory interfaces; off-chip driver; on-die terminator; quantization error; robust impedance calibration scheme; signal integrity; Bandwidth; Calibration; Impedance; Linearity; MOSFETs; Resistors; Robustness; SDRAM; Temperature; Voltage;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1692757
