Title :
A 4-Gb/s/pin current mode 4-level simultaneous bidirectional I/O with current mismatch calibration
Author :
Kim, Yong Sin ; Shin, Sangho ; Kang, Sung-Mo
Author_Institution :
Dept. of Electr. Eng., California Univ., Santa Cruz, CA
Abstract :
This paper describes a high speed current mode multilevel simultaneous bi-directional I/O which calibrates pin-to-pin current mismatch. Output impedance is controlled by an impedance matching circuit reducing process variation down to plusmn2.5%. Maximum 20% pin-to-pin current mismatch is reduced to 1.25% by 4-bit digital calibration scheme. Simulation results based on 0.18mum CMOS process show that the proposed design achieves 4-Gb/s/pin data rate with 512ps timing window and 27mV voltage window. I/O circuits consume 12mW/pin at a supply voltage of 1V
Keywords :
CMOS digital integrated circuits; current-mode circuits; impedance matching; integrated circuit design; 0.18 micron; 1 V; 4 bit; 4-bit digital calibration; 4-level simultaneous bidirectional I/O; CMOS integrated circuit; current mismatch calibration; data rate; high speed current mode; impedance matching circuit; pin-to-pin current mismatch; supply voltage; timing window; voltage window; Bandwidth; Bit error rate; Calibration; Circuit simulation; Clocks; Energy consumption; Impedance matching; Signal generators; Voltage; Wire;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1692758
