• DocumentCode
    2533451
  • Title

    Verifying finite element simulation for a piezoresistive MEMS sensor

  • Author

    Benfield, D. ; Moussa, W. ; Lou, E.

  • Author_Institution
    Alberta Univ., Edmonton, Alta., Canada
  • fYear
    2005
  • fDate
    24-27 July 2005
  • Firstpage
    454
  • Abstract
    The use of finite element analysis to simulate the performance of a piezoresistive sensor is a technique that potentially allows for more efficient design and revision of MEMS devices. By comparing the performance of a FEA pressure sensor to that of an actual device as manufactured allows the capabilities of current simulation software in this field to be examined.
  • Keywords
    finite element analysis; microsensors; piezoresistive devices; FEA pressure sensor; current simulation software; finite element simulation; piezoresistive MEMS sensor; Analytical models; Biomembranes; Finite element methods; Manufacturing processes; Mechanical sensors; Micromechanical devices; Piezoresistance; Silicon devices; Solid modeling; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MEMS, NANO and Smart Systems, 2005. Proceedings. 2005 International Conference on
  • Print_ISBN
    0-7695-2398-6
  • Type

    conf

  • DOI
    10.1109/ICMENS.2005.131
  • Filename
    1540875