DocumentCode :
2533609
Title :
Delay Insensitivity Does Not Mean Slope Insensitivity!
Author :
Ouchet, Florent ; Morin-Allory, Katell ; Fesquet, Laurent
Author_Institution :
TIMA Lab., Grenoble INP, Grenoble, France
fYear :
2010
fDate :
3-6 May 2010
Firstpage :
176
Lastpage :
184
Abstract :
Asynchronous circuits are well known for their intrinsic robustness to process, voltage and temperature variations. Nevertheless, in some extreme cases, it appears that their robustness is not sufficient to guarantee a correct circuit behavior. This limitation, which is caused by an analog phenomenon, appears when the transition slopes in input of C-elements become very slow. This paper describes in details this phenomenon and studies the robustness of different C-element topologies. The simulations, which have been performed in 130, 65 and 45 nm CMOS technologies, show an overview of the C-element behavior in presence of these slow ramps. This gives a comprehensive understanding of the phenomenon and suggests an appropriate approach for choosing the well-suited C-element topology for everybody facing these difficulties.
Keywords :
CMOS integrated circuits; asynchronous circuits; circuit simulation; network topology; C-element topology; CMOS technology; asynchronous circuits; circuit behavior; delay insensitivity; intrinsic robustness; slope insensitivity; Aging; Asynchronous circuits; CMOS logic circuits; CMOS technology; Circuit simulation; Circuit topology; Delay systems; Laboratories; Robustness; Voltage; C-element; asynchronous logic; delay insensitivity; slope insensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asynchronous Circuits and Systems (ASYNC), 2010 IEEE Symposium on
Conference_Location :
Grenoble
ISSN :
1522-8681
Print_ISBN :
978-0-7695-4032-0
Electronic_ISBN :
1522-8681
Type :
conf
DOI :
10.1109/ASYNC.2010.27
Filename :
5476962
Link To Document :
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