Title :
A view of the AI-ESTATE architecture and the ABBET(TM) upper layers
Author :
Simpson, William R.
Author_Institution :
IDA, Alexandria, VA, USA
Abstract :
Work in the IEEE Standards Coordinating Committee 20 (SCC20) to develop standards for A Broad Based Environment for Test (ABBET) and for supporting intelligent diagnostics in test environments (AI-ESTATE) is coming to fruition. The ABBET subcommittee is preparing to ballot the “full-use” version of its architecture standard (P1226), and the AI-ESTATE subcommittee has published its architecture standard in “trial-use” form (P-1232). Although independent of the ABBET architecture, many view AI-ESTATE as an integral part of the ABBET family. In this paper, the author discusses the elements of AI-ESTATE as they might fit within the AI-ESTATE framework. He also discusses how a “systems view” to developing test environments facilitates this integration
Keywords :
IEEE standards; artificial intelligence; automatic test software; programming environments; software standards; ABBET; AI-ESTATE architecture; IEEE Standards Coordinating Committee 20; P-1232; P1226; SCC20; architecture standard; intelligent diagnostics; test environments; Artificial intelligence; Automatic testing; Electronic equipment testing; Life testing; Software standards; Software testing; Standards Coordinating Committees; Standards development; Standards publication; System testing;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547699
