• DocumentCode
    2533932
  • Title

    Timing-constrained yield-driven wire sizing for critical area minimization

  • Author

    Yan, Jin-Tai ; Chiang, Bo-Yi ; Lee, Chia-Fang

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Chung-Hua Univ., Hsinchu
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Abstract
    In this paper, given a rectilinear Steiner tree (RST) with a source and a set of sinks, it is assumed that any sink in the RST has its timing constraint. Based on the concept of timing-consistent wire widening for any wire segment, the width of any wire segment may be replaced with its timing-consistent width without destroying the timing constraint of any sink. Furthermore, according to a given particle defect size, the widths of all the wire segments are reassigned to minimize total critical area of the RST by running a timing-constrained wire sizing process. The experimental results show that our proposed timing-constrained yield-driven wire sizing (TYWS) approach increase about 50% routing area to reduce 80%~90% critical area for the tested routing nets
  • Keywords
    circuit layout; circuit optimisation; minimisation; trees (mathematics); wiring; critical area minimization; rectilinear Steiner tree; timing-constrained yield-driven wire sizing; wire widening; Clocks; Computer science; Delay; Joining processes; Routing; Steiner trees; Testing; Timing; Topology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Conference_Location
    Island of Kos
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1692785
  • Filename
    1692785