Title :
Quantum mechanical and transport aspects of resolving discrete charges in nano-CMOS device simulation
Author :
Asenov, A. ; Roy, G. ; Alexander, C. ; Brown, A.R. ; Watling, J.R. ; Roy, S.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
Abstract :
We present pragmatic approaches which allow coherent treatment of individual discrete charges in the simulation of nanoscaled MOSFETs. The quantum confinement aspects associated with the Coulomb potential well of individual charges (dopants and/or trapped carriers) are treated using the density gradient approach applied to both the channel and the bulk carriers in a drift diffusion framework. The Coulomb scattering from individual charges is treated through the real space trajectories of the carriers in a Monte Carlo framework applying short range corrections to the mesh calculated forces. The two techniques are joined together in frozen field ´atomistic´ simulations of decanano MOSFETs.
Keywords :
MOSFET; Monte Carlo methods; diffusion; electric potential; electron traps; gradient methods; hole traps; nanoelectronics; semiconductor device models; short-range order; Coulomb scattering; Monte Carlo method; atomistic simulation; carrier trap; coherent treatment; coulomb potential well; decanano MOSFET; density gradient method; discrete charge resolving; dopants; drift diffusion; nanoCMOS device simulation; nanoscaled MOSFET; quantum confinement; quantum mechanical simulation; real space trajectory; CMOS technology; Carbon nanotubes; Electron mobility; Electron traps; MOSFETs; Nanoscale devices; Potential well; Proteins; Quantum mechanics; Semiconductor process modeling;
Conference_Titel :
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN :
0-7803-8536-5
DOI :
10.1109/NANO.2004.1392342