Title :
Special properties of molding compounds for large surface-mounting devices
Author :
Ito, Satoshi ; Oizumi, Shinichi ; Adachi, Junichi ; Shimizu, Masato ; Suzuki, Hideto
Author_Institution :
Nitto Electr. Ind. Co. Ltd., Mie, Japan
Abstract :
Package cracking has become a problem in surface-mount technology as a result of larger package sizes, chip sizes and lead counts. To correct this problem, molding compounds suitable for use in surface mounting applications are being designed. One approach is to increase the cross-linking density of the organic resin to achieve a very-high strength at mounting temperatures. Another approach is to increase the resistance to stress using silicon modification and a very finely dispersed sea-island structure. Combining these two approaches yields a compound that delivers excellent performance as an encapsulant for SMT packages. The effects of the physical properties of this encapsulant, especially the flexural strength of the molding compound at soldering temperature, on preventing package swelling and package cracking at a temperature of 215 to 260 degrees C has been studied. Results are presented for 80-pin quad flat-package devices subjected to an 80 degrees C 85% RH environment after mold-cure and to a vapor phase soldering temperature of 215 degrees C after moisture absorption.<>
Keywords :
bending strength; encapsulation; polymers; surface mount technology; swelling; thermal stress cracking; 215 to 260 C; SMT packages; chip sizes; cross-linking density; encapsulation; finely dispersed sea-island structure; flexural strength; lead counts; moisture absorption; mold curing; molding compounds; organic resin; package cracking; package sizes; package swelling; quad flat-package devices; silicon modification; soldering temperature; surface-mount technology; vapor phase soldering temperature; Lead; Ocean temperature; Packaging; Resins; Sea surface; Soldering; Stress; Surface cracks; Surface resistance; Surface-mount technology;
Conference_Titel :
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/ECC.1988.12637