DocumentCode :
2534447
Title :
A Novel Technology Mapping Technique for BDD-Based Circuits Using LEAP Cells
Author :
Paul, Gopal ; Pal, Ajit ; Bhattacharya, Bhargab B.
Author_Institution :
Dept. of Comput. Sci. & Engg, IIT Kharagpur, Kharagpur, India
fYear :
2010
fDate :
20-22 Dec. 2010
Firstpage :
135
Lastpage :
140
Abstract :
Library-based Pass Transistor Logic (PTL) synthesis, like Lean Integration with Pass-Transistors (LEAP) synthesis, has drawn significant attention to the VLSI research community. In this paper, we first propose a modified Y3 LEAP cell that was originally invented by K. Yano, Y. Sasaki, K. Rikino and K. Seki. Secondly we propose a new technology dependent mapping technique and compare the results with the existing methods published in and. Our technique yields a significant reduction in number of cells used in the core logic block and in other parameters like power, delay and power-delay-product.
Keywords :
VLSI; integrated circuit design; logic circuits; BDD-based circuits; LEAP cells; VLSI research community; core logic block; lean integration with pass-transistors synthesis; technology mapping technique; transistor logic synthesis; Benchmark testing; Boolean functions; Data structures; Delay; Integrated circuit modeling; Inverters; Transistors; Binary Decision Diagram (BDD); Lean Integration with Pass-Transistors (LEAP); Low power; Pass Transistor Logic (PTL);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System Design (ISED), 2010 International Symposium on
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4244-8979-4
Electronic_ISBN :
978-0-7695-4294-2
Type :
conf
DOI :
10.1109/ISED.2010.34
Filename :
5715164
Link To Document :
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