Title :
Harmonic Performance Evaluation of CMOS SOI SPDT Switch with Embedded Lateral Substrate Model
Author :
Salimath, Akshaykumar ; Satyam, M.
Author_Institution :
Centre for VLSI & Embedded Syst. Technol., Int. Inst. of Inf. & Technol., Hyderabad, India
Abstract :
This paper describes a single pole, double throw (SPDT) CMOS SOI switch in 180nm Technology developed for the GSM 900MHz RF switch applications. Silicon-on-Insulator (SOI) CMOS FETs have many properties which are desirable for RF switch applications. By being manufactured on an insulator substrate, the bulk parasitic capacitances typical of CMOS FETs are eliminated. The SOI FET has a very low Ron-Coff product, allowing for low insertion loss and high isolation in high frequency applications. Despite the low breakdown voltage intrinsic to Si, SOI FETs can be stacked in series to withstand high voltages. This work discuss Harmonic Performance and Power handling behavior of SOI CMOS Switch with non-linear lateral substrate model as a function of gate and body biasing voltages.
Keywords :
CMOS integrated circuits; cellular radio; harmonic distortion; integrated circuit modelling; semiconductor switches; silicon-on-insulator; substrates; CMOS SOI SPDT switch; breakdown voltage; embedded lateral substrate model; frequency 900 MHz; harmonic performance evaluation; insertion loss; insulator substratebulk parasitic capacitance; nonlinear lateral substrate model; power handling behavior; radiofrequency switch; silicon-on-insulator; size 180 nm; Harmonic analysis; Insertion loss; Logic gates; Power system harmonics; Radio frequency; Switches; Switching circuits; 1DB COMPRESSION; HARMONICS; INSERTION LOSS; ISOLATION; SOI; SPDT SWITCH;
Conference_Titel :
Electronic System Design (ISED), 2010 International Symposium on
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4244-8979-4
Electronic_ISBN :
978-0-7695-4294-2
DOI :
10.1109/ISED.2010.43