• DocumentCode
    2534622
  • Title

    Harmonic Performance Evaluation of CMOS SOI SPDT Switch with Embedded Lateral Substrate Model

  • Author

    Salimath, Akshaykumar ; Satyam, M.

  • Author_Institution
    Centre for VLSI & Embedded Syst. Technol., Int. Inst. of Inf. & Technol., Hyderabad, India
  • fYear
    2010
  • fDate
    20-22 Dec. 2010
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    This paper describes a single pole, double throw (SPDT) CMOS SOI switch in 180nm Technology developed for the GSM 900MHz RF switch applications. Silicon-on-Insulator (SOI) CMOS FETs have many properties which are desirable for RF switch applications. By being manufactured on an insulator substrate, the bulk parasitic capacitances typical of CMOS FETs are eliminated. The SOI FET has a very low Ron-Coff product, allowing for low insertion loss and high isolation in high frequency applications. Despite the low breakdown voltage intrinsic to Si, SOI FETs can be stacked in series to withstand high voltages. This work discuss Harmonic Performance and Power handling behavior of SOI CMOS Switch with non-linear lateral substrate model as a function of gate and body biasing voltages.
  • Keywords
    CMOS integrated circuits; cellular radio; harmonic distortion; integrated circuit modelling; semiconductor switches; silicon-on-insulator; substrates; CMOS SOI SPDT switch; breakdown voltage; embedded lateral substrate model; frequency 900 MHz; harmonic performance evaluation; insertion loss; insulator substratebulk parasitic capacitance; nonlinear lateral substrate model; power handling behavior; radiofrequency switch; silicon-on-insulator; size 180 nm; Harmonic analysis; Insertion loss; Logic gates; Power system harmonics; Radio frequency; Switches; Switching circuits; 1DB COMPRESSION; HARMONICS; INSERTION LOSS; ISOLATION; SOI; SPDT SWITCH;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System Design (ISED), 2010 International Symposium on
  • Conference_Location
    Bhubaneswar
  • Print_ISBN
    978-1-4244-8979-4
  • Electronic_ISBN
    978-0-7695-4294-2
  • Type

    conf

  • DOI
    10.1109/ISED.2010.43
  • Filename
    5715173