DocumentCode
2534635
Title
Nano-CMOS Mixed-Signal Circuit Metamodeling Techniques: A Comparative Study
Author
Garitselov, Oleg ; Mohanty, Saraju P. ; Kougianos, Elias ; Patra, Priyadarsan
Author_Institution
NanoSystem Design Lab. (NSDL, http://nsdl.cse.unt.edu), Univ. of North Texas, Denton, TX, USA
fYear
2010
fDate
20-22 Dec. 2010
Firstpage
191
Lastpage
196
Abstract
Fast design space exploration of complex nano-CMOS mixed-signal circuits is an important problem. In this paper, a design process flow that uses metamodels is introduced. In this flow the most important task is the sampling of the design space. In this paper, different sampling techniques for producing an accurate metamodel are investigated to minimize the number of samples required by using a nano-CMOS ring oscillator (RO) as an example. Through SPICE simulations, it is shown that the parasitics have a drastic effect on performance metrics, such as the frequency of oscillation. Alternative sampling techniques, both random, such as Monte Carlo (MC), and uniform, such as Latin Hypercube Sampling (LHS), and Design of Experiments (DOE), are considered as and compared for speed and accuracy. Due to the time constraints of the circuit design process, this paper can be used as a guideline for which sampling technique will produce the most accurate result to minimize the design time. All a experimental results are presented for a 45 nm technology.
Keywords
CMOS integrated circuits; Monte Carlo methods; SPICE; design of experiments; mixed analogue-digital integrated circuits; nanoelectronics; Latin hypercube sampling; Monte Carlo method; SPICE simulations; design of experiments; design process flow; metamodeling techniques; nano-CMOS mixed-signal circuit; Hypercubes; Integrated circuit modeling; Layout; Mathematical model; Ring oscillators; Semiconductor device modeling; US Department of Energy; Circuit Simulation; Metmodeling; Mixed-Signal Circuits; Nanoscale CMOS; Statistical Sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System Design (ISED), 2010 International Symposium on
Conference_Location
Bhubaneswar
Print_ISBN
978-1-4244-8979-4
Electronic_ISBN
978-0-7695-4294-2
Type
conf
DOI
10.1109/ISED.2010.44
Filename
5715174
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