• DocumentCode
    2535225
  • Title

    Efficient solution to selective wet etching of ultra-thick copper sacrificial layer with high selective etching ratio

  • Author

    Wu, Y.B. ; Ding, G.F. ; Wang, H. ; Zhang, C.C.

  • Author_Institution
    Nat. Key Lab. of Nano/Micro Fabrication Technol., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    1388
  • Lastpage
    1391
  • Abstract
    In this paper, developed is an effective solution to selective etching of ultra-thick copper sacrificial layer for the realization of 3-D suspended metal microstructures, in which the thickness of sacrificial Cu laminations can reach more than 100 microns. The proposed effective etching solution is based on an additive complex in the ammonia liquor with the assistance of oxidant. The primary purposes of the additive complex catalyst account for strengthening the complexing capabilities of the etching liquor as well as increasing the selective etching ratio of Cu. The effects of process conditions on etching rate and surface morphology were investigated. Therefore, the complex-based etching solution to ultra-thick Cu SL possesses unique features in high selective etching ratio, low-cost, high efficiency, time-saving, and compatible with MEMS process. The novel etching solution has a potential application in fabricating the complicated 3-D MEMS devices with movable suspensions.
  • Keywords
    copper; etching; micromachining; surface morphology; 3D MEMS devices; 3D suspended metal microstructures; MEMS process; additive complex; ammonia liquor; high selective etching ratio; movable suspensions; selective wet etching; ultra thick copper sacrificial layer; Copper; Etching; Gold; Nickel; Suspensions; 3-D surface micromachining; Copper sacrificial layer; Movable metal microstructure; Selective wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969530
  • Filename
    5969530