• DocumentCode
    2535339
  • Title

    Isotropic etching of 111 SCS for wafer-scale manufacturing of perfectly hemispherical silicon molds

  • Author

    Fegely, Laura C. ; Hutchison, David N. ; Bhave, Sunil A.

  • Author_Institution
    OxideMEMS Lab., Cornell Univ., Ithaca, NY, USA
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    2295
  • Lastpage
    2298
  • Abstract
    This paper reports the results of a side-by-side comparison study of HF-HNO3 isotropic etching of circular pits in <;111>; and <;100>; single crystal silicon (SCS). These etched holes will be used as sacrificial molds for micro-scale hemispherical resonator gyroscopes (HRGs) made using hemispherical shell resonators. Geometric uniformity of the mold is critical for HRG applications in order to achieve degenerate resonant modes and high optical and mechanical quality factors (Q). <;111>; wafers were found to provide excellent isotropic etching in the surface plane under all tested etching conditions with an average of only -1.4% radial variation, as compared to -3.2% variation for <;100>; wafers. The molds tested had an average radius of 41 μm, and depth of 35 μm, with a maximum of radius 92 μm with a depth of 95 μm.
  • Keywords
    Q-factor; elemental semiconductors; etching; gyroscopes; micromachining; micromechanical resonators; moulding; silicon; wafer-scale integration; SCS; Si; circular pits; degenerate resonant modes; geometric uniformity; hemispherical shell resonator; isotropic wet etching; mechanical quality factor; microscale HRG; microscale hemispherical resonator gyroscope; optical quality factor; perfectly hemispherical silicon molds; single crystal silicon; wafer scale manufacturing; Acoustics; Chemicals; Etching; Gyroscopes; Hafnium; Shape; Silicon; 3D micromachining; Isotropic wet etching; gyroscope; hemispherical shell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969536
  • Filename
    5969536