• DocumentCode
    2535553
  • Title

    Regularity of breakdown of solid dielectrics after moisture absorption

  • Author

    Jujian, Wang ; Huaiping, Lu ; Zhonshou Zhu

  • Author_Institution
    Guangzhou Electr. Apparatus Res. Inst., China
  • fYear
    1988
  • fDate
    12-16 Sep 1988
  • Firstpage
    412
  • Abstract
    The authors examine the usually encountered problems of environmental compatibility experiments on the breakdown of solid dielectrics after moisture absorption. These include: (1) the excessive reduction of dielectric strength and (2) an abnormal phenomenon in the case of which increases in moisture absorption cause the dielectric strength of the solid dielectric to increase at the start and then to decrease. Three essential types of phenomena involving the relationship between the increasing amount of moisture absorption and dielectric strength for different kinds of solid dielectrics are stated. These phenomena are as follows: the dielectric strength decreases slightly with increasing amount of moisture absorption: dielectric strength decreases abruptly at the beginning and then keeps steady; the dielectric strength increases at the beginning and then decreases or keeps steady. The occurrence of the three types of phenomena is chiefly due to the fact that, during the measurements, the effects of absorbed water film on the dielectric surface and permeated water into the interior of the dielectric distort the original distribution of electric field
  • Keywords
    electric breakdown of solids; electric strength; moisture; abnormal phenomenon; absorbed water film; breakdown of solid dielectrics; dielectric surface; distribution of electric field; environmental compatibility experiments; moisture absorption; permeated water; reduction of dielectric strength; Absorption; Atmosphere; Breakdown voltage; Dielectric breakdown; Electrodes; Frequency; Moisture; Plastics; Solids; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
  • Conference_Location
    Beijing
  • Type

    conf

  • DOI
    10.1109/ICPADM.1988.38421
  • Filename
    38421