DocumentCode
2535590
Title
Device for conductance measurements of molecular systems
Author
Lambacher, Michael ; Dupraz, Christian J F ; Beierlein, Udo ; Kotthaus, Jörg P. ; Schuber, Ulrich S. ; Andres, Philip R.
Author_Institution
Center for NanoScience & Sekt. Phys., Ludwig-Maximilians-Univ., Munchen, Germany
fYear
2004
fDate
16-19 Aug. 2004
Firstpage
515
Lastpage
517
Abstract
A device for conductance measurements of small molecular systems was fabricated. The device consists of two overlapping electrodes, separated by a thin layer of aluminium oxide. The oxide was partly etch away giving rise to a slit in which molecules can be inserted. Measurements were carried out on terpyridine based molecular chains.
Keywords
aluminium compounds; electric admittance measurement; etching; molecular electronics; organic compounds; Al2O3; aluminium oxide; conductance measurements; etching; molecular systems; overlapping electrodes; terpyridine based molecular chains; thin layer; Chemistry; Electrodes; Electron beams; Etching; Gold; Laboratories; Lithography; Rough surfaces; Self-assembly; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN
0-7803-8536-5
Type
conf
DOI
10.1109/NANO.2004.1392404
Filename
1392404
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