• DocumentCode
    2535590
  • Title

    Device for conductance measurements of molecular systems

  • Author

    Lambacher, Michael ; Dupraz, Christian J F ; Beierlein, Udo ; Kotthaus, Jörg P. ; Schuber, Ulrich S. ; Andres, Philip R.

  • Author_Institution
    Center for NanoScience & Sekt. Phys., Ludwig-Maximilians-Univ., Munchen, Germany
  • fYear
    2004
  • fDate
    16-19 Aug. 2004
  • Firstpage
    515
  • Lastpage
    517
  • Abstract
    A device for conductance measurements of small molecular systems was fabricated. The device consists of two overlapping electrodes, separated by a thin layer of aluminium oxide. The oxide was partly etch away giving rise to a slit in which molecules can be inserted. Measurements were carried out on terpyridine based molecular chains.
  • Keywords
    aluminium compounds; electric admittance measurement; etching; molecular electronics; organic compounds; Al2O3; aluminium oxide; conductance measurements; etching; molecular systems; overlapping electrodes; terpyridine based molecular chains; thin layer; Chemistry; Electrodes; Electron beams; Etching; Gold; Laboratories; Lithography; Rough surfaces; Self-assembly; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2004. 4th IEEE Conference on
  • Print_ISBN
    0-7803-8536-5
  • Type

    conf

  • DOI
    10.1109/NANO.2004.1392404
  • Filename
    1392404