DocumentCode :
2535662
Title :
Measurement of charge distributions in insulating materials for high voltage cables
Author :
Alquie, C. ; Ditchi, T. ; Lewiner, J.
Author_Institution :
Ecole Superieure de Phys. et de Chimie Ind., Paris, France
fYear :
1988
fDate :
12-16 Sep 1988
Firstpage :
434
Abstract :
Evolutions in time of charge distributions in thick dielectric insulators such as those used in high-voltage DC insulation are investigated. The pressure wave propagation (PWP) method has been applied to low-density, high-density, and cross-linked polyethylene under electric stress. It is shown that the impurities contained in carbon-loaded polyethylene electrodes play a very significant role in the development of a space charge distribution within the insulator. It is suggested that, by studying the evolution of the charge distributions, it is possible to determine whether a stabilization occurs and how much time is required to reach this stabilization, depending on the temperature and the applied voltage. Consequently, such a measurement made on samples having the same structure as the cables will help in defining tests and standard procedures for equipment evaluation
Keywords :
DC power transmission; cable insulation; high-voltage techniques; materials testing; organic insulating materials; polymers; HDPE; HVDC; LDPE; XLPE; carbon-loaded polyethylene electrodes; charge distribution measurement; cross-linked polyethylene; defining tests; equipment evaluation; high voltage cables; high-voltage DC insulation; insulating materials; pressure wave propagation; space charge distribution; stabilization; standard procedures; thick dielectric insulators; Charge measurement; Current measurement; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electrodes; Impurities; Polyethylene; Space charge; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
Conference_Location :
Beijing
Type :
conf
DOI :
10.1109/ICPADM.1988.38427
Filename :
38427
Link To Document :
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