Title :
Controlled growth of carbon nanotubes on microstructured surfaces
Author :
Keles, Yanki ; Milas, Mirko ; Thommen, Verena ; Fahlbusch, Stephan ; Stöckli, Thomas ; Meyer, Ernst ; Forró, László ; Knapp, Helmut F.
Author_Institution :
Centre Suisse d´´Electronique et de Microtechn. SA, Switzerland
Abstract :
Carbon nanotubes (CNTs) are known to enhance the scanning performance of AFM tips when mounted on AFM tips. There are different ways to synthesize CNTs, i.e. arc-discharge and chemical vapor deposition (CVD). CNTs have been directly grown on atomic force microscopy (AFM) tips by CVD. CNTs produced by arc-discharge method have been mechanically attached onto AFM tips to compare the performance of different types of CNTs. AFM images have been gathered with these CNT AFM tips. Present results show that arc-discharge CNT AFM tips have better scanning performances than the Si AFM tips.
Keywords :
atomic force microscopy; carbon nanotubes; chemical vapour deposition; nanotechnology; plasma deposition; surface structure; AFM; C; arc discharge method; atomic force microscopy; carbon nanotube growth; chemical vapor deposition; microstructured surfaces; Atomic force microscopy; Atomic layer deposition; Carbon nanotubes; Chemical technology; Chemical vapor deposition; Large-scale systems; Materials science and technology; Mechanical factors; Physics; Silicon;
Conference_Titel :
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN :
0-7803-8536-5
DOI :
10.1109/NANO.2004.1392412
