DocumentCode :
2535842
Title :
Multi-physics analysis for assembling of nano particle under the mixture condition of the dielectric fluid and AC electric field
Author :
Kwon, Soon-Geun ; Kim, Soo-Hyun ; Yoo, Yeong-Eun ; Lee, Eung-Sug ; Han, Chang-Soo
Author_Institution :
Korea Adv. Inst. of Sci. & Technol, Daejeon, South Korea
fYear :
2004
fDate :
16-19 Aug. 2004
Firstpage :
547
Lastpage :
549
Abstract :
We report the multi-physics analysis results for assembling process of the carbon nanotube (CNT) to the AFM probe using dielectrophoresis. Analysis fields for this include fluid dynamics, electric field, and particle dynamics. We completed the coupled equations for multi-disciplinary regions and simulated the attraction procedure of carbon nanotubes in a dielectric medium under the non-uniform electric fields using FEA (finite element analysis) technique. Finally, the optimum assembling condition for CNT AFM tip was suggested.
Keywords :
atomic force microscopy; carbon nanotubes; electrophoresis; finite element analysis; nanoparticles; nanotechnology; self-assembly; AC electric field; AFM probe; AFM tip; C; FEA; assembling process; carbon nanotube; dielectric fluid; dielectric medium; dielectrophoresis; finite element analysis; fluid dynamics; mixture; multiphysics analysis; nanoparticle; nonuniform electric fields; particle dynamics; Analytical models; Assembly; Carbon nanotubes; Dielectrics; Dielectrophoresis; Electric fields; Equations; Fluid dynamics; Nonuniform electric fields; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN :
0-7803-8536-5
Type :
conf
DOI :
10.1109/NANO.2004.1392415
Filename :
1392415
Link To Document :
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