DocumentCode :
2535862
Title :
The Neural Engineering of ATE
Author :
Kirkland, Larry V. ; Wright, R. Glenn
Author_Institution :
OO-ALC/TISAC, Hill AFB, UT, USA
fYear :
1996
fDate :
16-19 Sep 1996
Firstpage :
292
Lastpage :
297
Abstract :
This paper describes a neural network-based software configuration implemented on a VXI automatic test equipment platform. The purpose of this unique software configuration, incorporating neural network and other artificial intelligence (AI) technologies, is to enhance ATE capability end efficiency by providing an intelligent interface for a variety of functions that are controlled or monitored by the software. This includes automated end user-directed control of the ATE end diagnostic strategy to streamline test sequences through the use of advanced diagnostic strategies. The use of Neural Engineering techniques are stressed which, in this context, foster the integration of diverse sensor technology capable of analyzing units under test (UUT) from different perspectives that provide new insight into static, dynamic, and historical UUT performance. Such methods can achieve greater accuracy in failure diagnosis and fault prediction; reduction in cannot duplicate (CND), retest-OK (RTOK) rates, and ambiguity group size; and improved confidence in performance testing that results in the determination of UUT ready for issue status. The hardware configuration of the ATE consists of an embedded 486 100 MHz PC controller and an instrument suite as follows: Power Supply, DMM, Digitizer, Counter/Timer, Digital I/O, Pulse Generator, Switching Matrix, Relay, Function Generator and Arbitrary Function Generator
Keywords :
automatic test equipment; automatic test software; fault diagnosis; learning (artificial intelligence); neural nets; user interfaces; 100 MHz; AI; ATE; PC controller; UUT performance; VXI automatic test equipment; ambiguity group size; artificial intelligence; diagnostic strategy; failure diagnosis; fault prediction; intelligent interface; network-based software configuration; neural engineering; performance testing; test sequences; user-directed control; Artificial intelligence; Artificial neural networks; Automatic control; Automatic test equipment; Automatic testing; Intelligent networks; Monitoring; Neural engineering; Performance analysis; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
ISSN :
1088-7725
Print_ISBN :
0-7803-3379-9
Type :
conf
DOI :
10.1109/AUTEST.1996.547712
Filename :
547712
Link To Document :
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