• DocumentCode
    2535911
  • Title

    Influence of Parameters of the Transient Grounding Model on Numerical Analysis and Experimental Verification

  • Author

    Hongbing, He ; Bihua, Zhou ; Jiaqing, Chen

  • Author_Institution
    PLA Univ. of Sci. & Tech., Nanjing
  • fYear
    2007
  • fDate
    23-26 Oct. 2007
  • Firstpage
    27
  • Lastpage
    30
  • Abstract
    This paper discussed the influence of the parameters of the transient grounding model on numerical analysis using FDTD method; some useful results are given and verified by the experiment.
  • Keywords
    earthing; finite difference time-domain analysis; transients; FDTD method; numerical analysis; transient grounding model; EMP radiation effects; Electrodes; Fluctuations; Grounding; Magnetic analysis; Numerical analysis; Numerical models; Testing; Transient analysis; Voltage; Grounding; Grounding Experiment; Transient grounding resistance (TGR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
  • Conference_Location
    Qingdao
  • Print_ISBN
    978-1-4244-1371-3
  • Electronic_ISBN
    978-1-4244-1372-0
  • Type

    conf

  • DOI
    10.1109/ELMAGC.2007.4413423
  • Filename
    4413423