Title :
Recognition of Airport Runways in FLIR Images Based on Knowledge
Author :
Wei Wu ; Renbo Xia ; Wei Xiang ; Bin Hui ; Zheng Chang ; Yunpeng Liu ; Yahong Zhang
Author_Institution :
Univ. of Chinese Acad. of Sci., Beijing, China
Abstract :
Airport runway recognition technology would play an important role in developing intelligent weapon systems in the future. In this letter, a method of automatically finding runways in forward looking infrared (FLIR) images is proposed based on the knowledge of vision. First, the line segments in the images are extracted by a fast line segment detector (LSD) and an improved line segment linking method. Then, the regions of interest (ROI) of runways are detected using some constraint rules based on the direction, gradient, and width of line segment pairs. Afterward, an ROI length backtracking technique based on texture distribution is presented to retrieve the complete ROI. Finally, using runway regional self-similarity and contextual information, several decision criteria are formulated to accurately recognize the runway. Experimental results on the FLIR images with different imaging ranges show that the proposed algorithm is robust and has a good real-time performance.
Keywords :
airports; backtracking; edge detection; feature extraction; fractals; image texture; infrared imaging; military aircraft; object detection; object recognition; weapons; FLIR image; LSD; ROI length backtracking technique; ROI retrieval; airport runways recognition; constraint rules; contextual information; decision criteria; forward looking infrared; intelligent weapon systems; line segment detector; line segment direction; line segment gradient; line segment linking method; line segment pairs width; line segments extraction; regions of interest; runway regional self-similarity; runways detection; texture distribution; Airports; Image edge detection; Image segmentation; Imaging; Joining processes; Target recognition; Airport runway recognition; forward looking infrared (FLIR) images; linear feature extraction; region-of-interest (ROI) length backtracking; texture similarity;
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
DOI :
10.1109/LGRS.2014.2299898