Design and analysis of SET circuits: using MATLAB modules and SIMON

Author

Sulieman, Mawahib ; Beiu, Valeriu

Author_Institution

Sch. of EE&CS, Washington State Univ., Pullman, WA, USA

fYear

2004

fDate

16-19 Aug. 2004

Firstpage

618

Lastpage

621

Abstract

This paper describes two MATLAB modules which have been developed for enhancing SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first module facilitates the hierarchical design of larger SET circuits, and has: (i) a sub-module that builds a larger circuit - starting from a library of gates; while (ii) another sub-module allows for an easier specification of the input signals. The second module allows for the statistical analysis of SET circuits. The usefulness of the two modules has already been established through: (i) the design, simulation, and characterization of an advanced 16-bit capacitive SET threshold logic adder; (ii) the comparison of many different SET full adders; (iii) an analysis of the sensitivity to variations of different SET gates; and (iv) an analysis of a novel fault-tolerant architecture based on multiplexing.

Keywords

Monte Carlo methods; adders; circuit simulation; fault tolerance; logic design; logic gates; logic simulation; multiplexing; single electron devices; statistical analysis; threshold logic; MATLAB modules; Monte Carlo simulator; SIMON; fault-tolerant architecture; full adders; multiplexing; single electron technology circuits; statistical analysis; threshold logic adder; Adders; Analytical models; Circuit analysis; Circuit simulation; Electrons; Libraries; MATLAB; Monte Carlo methods; Signal design; Statistical analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology, 2004. 4th IEEE Conference on

Print_ISBN

0-7803-8536-5

Type

conf

DOI

10.1109/NANO.2004.1392438

Filename

1392438