Title :
Implementing APD Measurement in Monolithic Circuits
Author :
Song, Chen ; Fei, Sha ; Fei, Yang
Author_Institution :
Beijing Jiaotong Univ., Beijing
Abstract :
As a new measuring method for the frequency range 1 GHz to 18 GHz, amplitude distribution probability (APD) method had been formally written into CISPR 16-1-1 Ed. 2: Specification for radio disturbance and immunity measuring apparatus and methods in 2005. For the traditional EMI receivers that are employed widely in most EMC test labs, additional measuring apparatus were necessary to implementing APD measurement. Herein, we introduced an APD measuring apparatus that developed by EMC Research Section, Beijing Jiaotong University, PRC. This apparatus was designed based on fast analog-digital conversion and VLSI technology. All the digital logic function was built in a single field programmable gate arrays (FPGA) device. And all of the specification meets the requirements of CICPR16-1-1.
Keywords :
VLSI; analogue-digital conversion; digital integrated circuits; electromagnetic compatibility; electromagnetic interference; field programmable gate arrays; monolithic integrated circuits; probability; APD measurement; Beijing; CICPR16-1-1 requirements; EMC test labs; EMI receivers; FPGA; Jiaotong University; VLSI technology; amplitude distribution probability method; analog-digital conversion; digital logic function; field programmable gate arrays; frequency 1 GHz to 18 GHz; monolithic circuits; Circuits; Electromagnetic compatibility; Electromagnetic interference; Field programmable gate arrays; Frequency measurement; Immunity testing; Partial response channels; Programmable logic arrays; Receivers; Very large scale integration; A/D conversion; APD; EMI measuring apparatus; FPGA;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-1371-3
Electronic_ISBN :
978-1-4244-1372-0
DOI :
10.1109/ELMAGC.2007.4413456
