DocumentCode :
2536563
Title :
Inexpensive approach to dielectric measurements
Author :
Korpas, Przemyslaw ; Wojtasiak, Wojciech ; Krupka, Jerzy ; Gwarek, Wojciech
Author_Institution :
Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
Volume :
1
fYear :
2012
fDate :
21-23 May 2012
Firstpage :
154
Lastpage :
157
Abstract :
Split post dielectric resonators (SPDR) are commonly used for measurements of complex permittivity and losses measurements of many materials. The permittivity of the sample is calculated basing on the change in a resonance curve of the loaded and unloaded SPDR. The paper presents an inexpensive replacement for Vector Network Analyser normally used to determine the resonator´s Q-factor. The proposed system is recommended for those customers, who don´t need such rich-featured equipment as VNAs.
Keywords :
Q-factor; dielectric resonators; network analysers; permittivity measurement; Q-factor; complex permittivity measurements; dielectric measurements; losses measurements; split post dielectric resonators; vector network analyser; Detectors; Frequency measurement; Permittivity measurement; Q factor; Resonant frequency; Wideband; Lorenz curve; Split post dielectoric resonator; q-factor; resonance frequency; vector network analyser;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Radar and Wireless Communications (MIKON), 2012 19th International Conference on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4577-1435-1
Type :
conf
DOI :
10.1109/MIKON.2012.6233486
Filename :
6233486
Link To Document :
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