• DocumentCode
    2536623
  • Title

    Artificial intelligence in test

  • Author

    Dean, Jeffrey S.

  • Author_Institution
    Adv. Diagnostics & Technol. Insertion Center, Kelly AFB, TX, USA
  • fYear
    1996
  • fDate
    16-19 Sep 1996
  • Firstpage
    309
  • Lastpage
    313
  • Abstract
    This paper discusses the subject of applying artificial intelligence techniques to automatic test. It has been the experience of the author that AI is not a “magic bullet”, and that its successful use requires an understanding of both the technology and the repair process if is being applied to
  • Keywords
    artificial intelligence; automatic testing; circuit testing; artificial intelligence; automatic test; repair process; Artificial intelligence; Artificial neural networks; Automatic testing; Circuit analysis; Circuit testing; Expert systems; Genetic algorithms; Infrared detectors; System testing; Vehicle crash testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
  • Conference_Location
    Dayton, OH
  • ISSN
    1088-7725
  • Print_ISBN
    0-7803-3379-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1996.547718
  • Filename
    547718
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2536623