Title :
C-17 depot test requirements document to test program set development process
Author :
Pai, Curtis P. ; Phan, Jim K. ; McGavern, Robert J. ; Reeves, William E.
Author_Institution :
McDonnell Douglas Corp., Long Beach, CA, USA
Abstract :
Test Program Set (TPS) development time and cost are significantly reduced if test requirements document (TRD) development is performed with a rigorous, automated engineering process. This paper describes a proven process used in C-17 depot avionics TRD development. LexsysTM test development environment (TDE) tools automate this process by providing an intuitive user interface, test analysis tools, and document composition capability. Products of this process are easily transitioned to material for TPS Critical Design Review (CDR) presentation
Keywords :
automatic test software; electronic equipment testing; fault diagnosis; maintenance engineering; military avionics; software development management; C-17 depot avionics; C-17 depot test; Lexsys; automated engineering process; cost; diagnostic test; document composition; engineering notebook; fault list; performance test; test analysis tools; test program set development; test requirements document; time; user interface; Aerospace electronics; Aerospace testing; Automatic testing; Circuit analysis; Circuit faults; Circuit testing; Data acquisition; Maintenance engineering; Scheduling; Text analysis;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547723
