C-17 depot test requirements document to test program set development process

Author

Pai, Curtis P. ; Phan, Jim K. ; McGavern, Robert J. ; Reeves, William E.

Author_Institution

McDonnell Douglas Corp., Long Beach, CA, USA

fYear

1996

fDate

16-19 Sep 1996

Firstpage

344

Lastpage

351

Abstract

Test Program Set (TPS) development time and cost are significantly reduced if test requirements document (TRD) development is performed with a rigorous, automated engineering process. This paper describes a proven process used in C-17 depot avionics TRD development. Lexsys^TM test development environment (TDE) tools automate this process by providing an intuitive user interface, test analysis tools, and document composition capability. Products of this process are easily transitioned to material for TPS Critical Design Review (CDR) presentation

Keywords

automatic test software; electronic equipment testing; fault diagnosis; maintenance engineering; military avionics; software development management; C-17 depot avionics; C-17 depot test; Lexsys; automated engineering process; cost; diagnostic test; document composition; engineering notebook; fault list; performance test; test analysis tools; test program set development; test requirements document; time; user interface; Aerospace electronics; Aerospace testing; Automatic testing; Circuit analysis; Circuit faults; Circuit testing; Data acquisition; Maintenance engineering; Scheduling; Text analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '96, Test Technology and Commercialization. Conference Record

Conference_Location

Dayton, OH

ISSN

1088-7725

Print_ISBN

0-7803-3379-9

Type

conf

DOI

10.1109/AUTEST.1996.547723

Filename

547723