Title :
C-17 O-level fault detection and isolation bit improvement concepts
Author :
Sudolsky, Michael D.
Author_Institution :
McDonnell Douglas Corp., Long Beach, CA, USA
Abstract :
C-17 avionics built-in test (BIT) improvement is critical to mission readiness and capability. While many dramatic successes in 1995 led to the Department of Defense decision to build 120 C-17 airlifters, one area that still warrants improvement is a reduction in cannot-duplicate (CND) failure conditions. The primary goal of the MDA internal research and development (IR&D) maintenance diagnostics/fault data analysis and reporting (MD/FDAR) project is line-replaceable unit (LRU) CND reduction; a corresponding benefit is the transformation of raw recorded aircraft data into more useful maintenance information
Keywords :
aircraft; aircraft maintenance; data analysis; failure analysis; fault diagnosis; military avionics; military computing; reliability; BIT; C-17 O-level fault detection; C-17 avionics; Department of Defense; built-in test; cannot-duplicate failure; failure; fault data analysis; fault data reporting; fault isolation; line-replaceable unit; maintenance diagnostics; mission readiness; Aerodynamics; Aerospace electronics; Aerospace testing; Aircraft propulsion; Built-in self-test; Computer crashes; Data analysis; Data processing; Fault detection; Filtering;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547725
